In this talk we will discuss an alternative design for testability method that simultaneously addresses three limitations of the traditional scan methods namely, test data volume, test application time, and test power. For the audience not familiar with the testing methods, we will also include a brief tutorial on the prevalent design for testability methods and test generation algorithms. We will then provide a traveling salesman formulation of the test application time problem in random access scan environment. Our results show that the random access scan can simultaneously reduce the test time, test data, and test power.