| 中尾 文香 | M, 2回目発表 | 情報セキュリティ工学 | 林 優一, 岡田 実, 小笠原 司, 藤本 大介 |
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title: Study on Impacts of Clock Glitch Caused by Disturbance on Motor Control Communication
abstract: A motor is often used for an actuator of a device that involves operations such as robots. The motor is driven by a motor driver, and the motor driver operates based on a command signal sent from a control integrated circuit (IC). Therefore, if a disturbance which can alter the command signal is injected, an error in the motor control operation can be generated. In this study, we evaluate the impact of a glitch on the motor operation. The glitch which affects the motor operation is generated by injecting disturbance into the clock signal between the control IC and the motor driver. language of the presentation: Japanese | |||
| 岡本 拓実 | M, 2回目発表 | 情報セキュリティ工学 | 林 優一, 岡田 実, 藤川 和利, 藤本 大介 |
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title: Study on Non-invasive Electromagnetic (EM) Fault Attack Focused on Statistical Properties of Faulty Ciphertexts
abstract: Non-Uniform Faulty Value Analysis (NUFVA) is an attack method which is based on statistical non-uniformal properties caused by an intentional interference to cryptographic modules. This method is known to be powerful attack which is also valid to modules with countermeasures by input randomization, since it requires only a reasonable number of any faulty cipher-text. In this research, secret keys are retrieved from the module using the NUFVA based on noninvasive Electromagnetic (EM) interference. Using this method, approaching to the module is not needed. Moreover, a mechanism that causes non-uniform values is analyzed which can be applied to design-guide of secured cryptographic modules against NUFVA. language of the presentation: Japanese | |||
| 川上 莉穂 | M, 2回目発表 | 情報セキュリティ工学 | 林 優一, 岡田 実, 安本 慶一, 藤本 大介 |
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title: Study on a Measurement Technique of Electromagnetic (EM) Information Leakage cuased by Intentional Electromagnetic Irradiation
abstract: Recently, a new threat that controls an intensity of electromagnetic (EM) information leakage by applying intentional EM irradiation from outside of the devises has been reported. As a result, it is now possible to acquire important information from the target devices. However, it is difficult to obtain information far away from the target devices due to self-interference wave generated during EM irradiation, which reduces signal to noise ration (SNR) of EM information leakage including target information. Also, a mixture of EM information leakages generated from a specific wires and interconnections having the same degree of sensitivity to the EM irradiation from the circuit. In this research, we propose an accurate method which accurately observes information leaked from the equipment via EM waves. To suppress the self-interference waves, specific antenna arrangement is proposed. Also, proper signal processing for the EM information leakage is conducted. The proposed method is validated through experiment that the proposed method can detect the target information leakage using intentional EM irradiation even at the far distance. language of the presentation: Japanese | |||
| 江頭 智也 | M, 2回目発表 | 情報セキュリティ工学 | 林 優一, 岡田 実, 安本 慶一, 藤本 大介 |
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title:Study on Manipulation of Analog to Digital Converter (ADC)Output Data by Intentional Electromagnetic Irradiation
abstract: Successive approximation register analog to digital converter (ADC) is widely adopted in many sensor systems due to its small form factor and low power consumption. However, if the ADC if affected by an intentional disturbance and error or degradation are generated, whole system performance and security of the system can be affected. Conventional studies have shown that output data can be tampered when reference voltage of the ADC is directly manipulated. In this study, we analyze impact of non-invasive intentional electromagnetic irradiation (IEMI) on output data of the ADC. The non-invasive IEMI is injected to the ADC test board which generate fluctuations in the reference voltage and the output data of the ADC is monitored. language of the presentation: Japanese | |||