| 講演者：
| Jaan Raik |
| 題目：
| Decision Diagram Based Test Methods for Digital Systems |
概要：
| The talk provides for an introduction to the problem of digital systems testing, which is followed by an overview of test methods. Tallinn University of Technology (TUT) has more than three decades of experience in implementing Decision Diagram (DD) models in test. Some of this experience is shared in the second part of the lecture by introducing alternative DD representations. In particular two DD models: structurally synthesized binary decision diagrams and high-level DDs are explained. It is shown how these models can be applied to solving different test tasks.
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