Institute of Computing Technology, Chinese Academy of Sciences
講演題目
Design-for-Testability of Integrated Circuits: Principles and Case Studies
概要
Testing is a key aspect of integrated circuits development, because
of its cost and impact on final product
reliability. Along with the increasing circuit size and shrinking
feature size, design-for-testability (DFT) plays
a more and more important role to improve test quality and reduce
test cost. In this talk, firstly we will introduce
the principles of DFT, including fault models, automatic test pattern
generation, scan design and memory
built-in-self-test, and then we will give cases of DFT for high
performance microprocessors such as CELL from
IBM/Toshiba/Sony and Alpha 21364 from Compaq/HP.