a Distinguished Professor, New Jersey Institute
of Technology, USA
講演題目
On-Line and Off-Line Test of Airborne Digital Systems: a Reliability Study
概要
This talk deals with studying the effects of both on-line and
off-line test during flight critical missions where safety is a
major issue. The on-line test, in this context, is a test performed
on a digital airborne system during some specified windows in time
while it is still performing its intended task. An off-line test is a
test that is performed on the digital system once it is taken
off-line because of a suspected failure. Both the on-line and the
off-line tests are performed during flight. The difference between
the two is that the off-line test can be made more effective than an
on-line test due to the longer amount of time available for testing.
Moreover, the off-line test may be designed to have diagnosis and
repair capabilities built-in. Upon successful repair, the faulty
processor may be re-configured back into the system. This capability
will undoubtedly increase the mission reliability.